Sunday, 02 March 2025

Time:
12:30 - 2:00 PM
Place:
t.b.a.
Presenter:
D. Schaumlöffel, Maria Angels Subirana, CNRS/Université de Pau et des Pays de l'Adour, IPREM UMR 5254, Hélioparc, 2, avenue du président Angot, F-64053 Pau (France)

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This short course introduces element-specific imaging techniques with a focus on secondary ion mass spectrometry (SIMS). The principles of SIMS, including ion sources and the ionization process, will be covered as well as the difference between dynamic and static SIMS techniques. This course also briefly discusses related X-ray based techniques such as electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDS, TEM-EDS). In a second part, secondary ion mass spectrometry at the nanoscale (NanoSIMS) will be the main topic for chemical and isotopic imaging at the nanometer scale: principle, ion sources, ion transmission, lateral resolution, mass resolution and useful yield. This course will also cover challenges in sample preparation, especially for biological material, and the combination with synchrotron-based techniques. Finally, the challenges and limitations of image data processing will be discussed and application examples from our laboratory will be presented.